Scientific publications

Launchpad

Scientific publications

Articles

  • SCHULER, A., HAUSOTTE, T. and SUN, Z.: Micro- and nanocoordinate measurements of micro-parts with 3-D tunnelling current probing. In: Journal of Sensors and Sensor Systems 4 (2015), pp. 199-208

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: Enhanced measurement of high aspect ratio surfaces by applied sensor tilting. In: ACTA IMEKO 3/3 (2014), pp. 22-27

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: Setup and evaluation of a sensor tilting system for dimensional micro- and nanometrology. In: Meas. Sci. Technol. 25 (2014), doi:10.1088/0957-0233/25/6/064010

  • SCHULER, A., WECKENMANN, A., HAUSOTTE, T. and HOFFMANN, J.: Quasitaktile 3-D-Mikro- und Nanosensorik und deren Anwendung. In: Werkstattstechnik online 11/12 2013 (2013)

  • SCHULER, A. and WECKENMANN, A.: Application of sensor tilting for enhanced measurement of microstructures. In: Proc IMechE Part B: J Engineering Manufacture 227(1) (2012), pp. 12-20

  • WECKENMANN, A. and SCHULER, A.: Aspects of micro-tactile dynamic sensor tracking. In: Int. J. Nanomanufacturing 8(5/6)(2012), pp. 450-466

  • WECKENMANN, A., SCHULER, A. and NGASSAM, R.J.B.: Enhanced measurement of steep surfaces by slope-adapted sensor tilting. In: Meas. Sci. Technol. 23 (2012), doi:10.1088/0957-0233/23/7/074007

  • WECKENMANN, A. and SCHULER, A.: Application of modern high resolution tactile sensors for micro-objects. In: Int. J. Precision Technology 2/2/3 (2011), pp. 266-288

  • HAUSOTTE, T., WECKENMANN, A. and SCHULER, A: Tunnelstromtaster für die Mikrokoordinatenmessung. In: VDI-Berichte 2133 2011, pp. 217-226

  • WECKENMANN, A., SUN, Z. and SCHULER, A.: Schottky emission effect in surface topography: Method and application. In: International Journal of Nanomanufacturing 7/2 (2011), pp.93-103

  • HOFFMANN, J. and SCHULER, A.: Nanometer resolving coordinate metrology using electrical probing. In: Technisches Messen 78/3 (2011), pp. 142-149

  • HOFFMANN, J., SCHULER, A. and WECKENMANN, A: Construction and evaluation of a traceable metrological scanning tunnelling microscope (abbreviated version). In: Mechatronik 118/10-11 (2010), pp. 19-20

  • HOFFMANN, J.; SCHULER, A. and WECKENMANN, A.: Construction and evaluation of a traceable metrological scanning tunnelling microscope. In: Measurement 42/9 (2009), pp. 1324-1329

  • HOFFMANN, J., WECKENMANN, A. and SCHULER, A.: Mikrokoordinatenmesstechnik mit elektrischer Werkstückantastung. In: Technisches Messen 76/2 (2009), pp. 91-97

  • WECKENMANN, A.; HOFFMANN, J. and SCHULER. A.: Development of a tunnelling current sensor for a long - range nano- positioning device. In: MST 19 (2008), ID 064002

Conferences

  • TIMMERMANN, M., WEINERT, B., SCHULER, A., LODERER, A. and HAUSOTTE, T.: Fibre-optical 3-D measurement of highly curved free-form surfaces. In: Proceedings 15th International Conference on Metrology and Properties of Engineering Surfaces (02.-05.03.2015, Charlotte, North Carolina, USA), article-ID: 3-4242

  • SCHULER, A., HAUSOTTE, T. and SUN, Z.: Micro and nanocoordinate measurements of microparts with 3D tunnelling current probing. In: Proceedings Sensoren und Messsysteme, 3./4.06.2014 Nuremberg, Germany, ISBN 978-3-8007-3622-5

  • TIAN, Y., WECKENMANN, A., HAUSOTTE, T., SCHULER, A. and HE, B.: Measurement strategies in optical 3-d surface measurement with focus variation. In: Proceedings of the 11th International Symposium on Measurement and Quality Control - 11th ISMQC (11.-13.09.2013, Krakau - Kielce, Polen).

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: Setup and evaluation of a sensor tilting system for dimensional micro and nanometrology. In: Proceedings of the 11th international symposium of measurement technology and intelligent instruments (ISMTII), 01.-05.07.2013, Aachen, Germany

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: Enhanced measurement of high aspect ratio surfaces by applied sensor tilting. In: Proceedings of the 20th IMEKO World Congress “Metrology for Green Growth”, 09. 14.09.2012, Busan, South Korea.

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: A setup for dynamic sensor rotation for high aspect ratio microstructure measurements. In: 10th international scientific conference “Coordinate Measuring Technique”, 23.-25.4.2012, Bielsko-Biala, Poland.

  • WECKENMANN, A. and SCHULER, A.: Application of sensor tilting for enhanced measurement of microstructures. In: 12th CIRP Conference on Computer Aided Tolerancing, 18.-19.04.2012, Huddersfield, England.

  • WECKENMANN, A., SCHULER, A. and NGASSAM, R.J.B.: Enhanced measurement of steep surfaces by sensor tilting. In: 56th International Scientific Colloquium, 12.-16.09.2011, Ilmenau, Germany.

  • WECKENMANN, A., SUN, Z.and SCHULER, A: Schottky emission effect in surface topography: Method and application. In: Programme and Abstracts Book of 2nd International Conference on Nanomanufacturing - nanoMan2010 and 1st CIRP Conference on Nanomanufacturing (24.-26.09.2010, Tianjin, China), pp. 28.

  • WECKENMANN, A., BÜTTGENBACH, S., TAN, Ö., HOFFMANN, J. and SCHULER, A.: Sensors for accurate geometric measurements in manufacturing. In: Proceedings Sensor 2009/2 (2009), pp. 133-138

  • WECKENMANN, A., SCHULER, A. and HOFFMANN, J.: Development of a tunnelling current sensor for a long range nano positioning device. In: Proceedings 10th CIRP Conference on Computer Aided Tolerancing, 21.-23.3.2007, Erlangen, Germany.

Books

  • SCHULER, A.: Erweiterung der Einsatzgrenzen von Sensoren für die Mikro- und Nanomesstechnik durch dynamische Sensornachführung unter Anwendung nanometeraufgelöster elektrischer Nahfeldwechselwirkung. Erlangen, Dissertation. Shaker Verlag, ISBN 978-3-8440-2299-5, 2013

Book chapters

  • SCHULER, A., WECKENMANN, A. and HAUSOTTE, T.: A setup for dynamic sensor rotation for high aspect ratio microstructure measurements. In: “Development of Surface Metrology”, Pawel Pawlus (Editor), University of Bielsko-Biala, ISBN 978-83-63713-24-9. pp. 9-18